| The scalable
In-Circuit Test Platform |
| |
| Application
Areas: |
 |
›
Complex PC-Boards with a high digital proportion
› High-volume
throughput, large PC-Board counts |
| |
| Features: |
|
›
Highest cost-efficiency
› Highest level
of Test Coverage at maximum speed
› 6-channel Analog
Subsystem
› Analog Precision
Instruments
› 1:1-Real-Pin-Architecture,
i.e. a driver/receiver pair is positioned behind every
test point at the interface. This enables testing of PC-Boards
with a high node-density and considerably reduces the
amount of work necessary for the transfer of Test Fixtures
from other system types as well as carrying out layout-changes.
› Can be upgraded
modularly in steps of 128 up to 3584 hybrid Test Points
(in the TR-8100LLV-Version up to 5632 Test Points).
› Support s both
standard as well as low-voltage Logics in one System
› Easy to operate
graphical Operating Interface |
| |
| Integrated
as Standard: |
|
›
Automatic Test Program Generator
› Auto-Debugger
for passive Components
› Learn-Automatisms
for Opens- and Shorts-Tests
› On-Board and
Flash Programming Tools
› NAND-Tree Model
Generator
› Agilent TestJet:
process for vector-less detection of open connections
on digital, analog and mixed-signal ICs, BGAs and Connectors
› QM- and Statistic-Tools
|
| |
| Options: |
|
›
Boundary-Scan Integration
› Intel Socket
Test
› Free-programmable
UUT Voltage and Power Supplies
› Hard- and Software
Converters for the Transfer of Test Fixtures and Programs
from GenRad, Teradyne and Agilent (HP3070) Test Systems.
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